| 2009 |
| 16 | EE | Eugeni García-Moreno,
Kay Suenaga,
Rodrigo Picos,
Sebastià A. Bota,
Miquel Roca,
Eugeni Isern:
Predictive test strategy for CMOS RF mixers.
Integration 42(1): 95-102 (2009) |
| 2007 |
| 15 | EE | José Luis Rosselló,
Carol de Benito,
Sebastià A. Bota,
Jaume Segura:
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.
DATE 2007: 1271-1276 |
| 14 | EE | X. Cano,
Sebastià A. Bota,
R. Graciani,
D. Gascón,
A. Herms,
A. Comerma,
Jaume Segura,
L. Garrido:
Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment.
IOLTS 2007: 183-184 |
| 13 | EE | José Luis Rosselló,
Vicens Canals,
Sebastià A. Bota,
Ali Keshavarzi,
Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs
CoRR abs/0710.4759: (2007) |
| 12 | EE | Kay Suenaga,
Rodrigo Picos,
Sebastià A. Bota,
Miquel Roca,
Eugeni Isern,
Eugenio García:
A Module for BiST of CMOS RF Receivers.
J. Electronic Testing 23(6): 605-612 (2007) |
| 2006 |
| 11 | EE | José Luis Rosselló,
Sebastià A. Bota,
Vicens Canals,
Ivan de Paúl,
Jaume Segura:
A Fully CMOS Low-Cost Chaotic Neural Network.
IJCNN 2006: 659-663 |
| 10 | EE | José Luis Rosselló,
Carol de Benito,
Sebastià A. Bota,
Jaume Segura:
Leakage Power Characterization Considering Process Variations.
PATMOS 2006: 66-74 |
| 9 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.
VTS 2006: 358-363 |
| 8 | EE | Sebastià A. Bota,
José Luis Rosselló,
Carol de Benito,
Ali Keshavarzi,
Jaume Segura:
Impact of Thermal Gradients on Clock Skew and Testing.
IEEE Design & Test of Computers 23(5): 414-424 (2006) |
| 2005 |
| 7 | EE | José Luis Rosselló,
Vicens Canals,
Sebastià A. Bota,
Ali Keshavarzi,
Jaume Segura:
A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.
DATE 2005: 206-211 |
| 6 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura:
Smart Temperature Sensor for Thermal Testing of Cell-Based ICs.
DATE 2005: 464-465 |
| 5 | EE | B. Alorda,
Sebastià A. Bota,
Jaume Segura:
A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.
IOLTS 2005: 177-182 |
| 4 | EE | José Luis Rosselló,
Sebastià A. Bota,
Jaume Segura:
Compact Static Power Model of Complex CMOS Gates.
PATMOS 2005: 348-354 |
| 2004 |
| 3 | | Raimon Casanova,
José Luis Merino,
Ángel Dieguez,
Sebastià A. Bota,
Josep Samitier:
A mixed-mode temperature control circuit for gas sensors.
ISCAS (4) 2004: 896-909 |
| 2 | EE | Sebastià A. Bota,
M. Rosales,
José Luis Rosselló,
Jaume Segura,
Ali Keshavarzi:
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.
ITC 2004: 1276-1284 |
| 2001 |
| 1 | EE | José Luis Merino,
Sebastià A. Bota,
A. Herms,
Josep Samitier,
Enric Cabruja,
X. Jordà,
M. Vellvehí,
J. Bausells,
A. Ferré,
J. Bigorr:
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.
IOLTW 2001: 122-126 |