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Sebastià A. Bota

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2009
16EEEugeni García-Moreno, Kay Suenaga, Rodrigo Picos, Sebastià A. Bota, Miquel Roca, Eugeni Isern: Predictive test strategy for CMOS RF mixers. Integration 42(1): 95-102 (2009)
2007
15EEJosé Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura: Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs. DATE 2007: 1271-1276
14EEX. Cano, Sebastià A. Bota, R. Graciani, D. Gascón, A. Herms, A. Comerma, Jaume Segura, L. Garrido: Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment. IOLTS 2007: 183-184
13EEJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs CoRR abs/0710.4759: (2007)
12EEKay Suenaga, Rodrigo Picos, Sebastià A. Bota, Miquel Roca, Eugeni Isern, Eugenio García: A Module for BiST of CMOS RF Receivers. J. Electronic Testing 23(6): 605-612 (2007)
2006
11EEJosé Luis Rosselló, Sebastià A. Bota, Vicens Canals, Ivan de Paúl, Jaume Segura: A Fully CMOS Low-Cost Chaotic Neural Network. IJCNN 2006: 659-663
10EEJosé Luis Rosselló, Carol de Benito, Sebastià A. Bota, Jaume Segura: Leakage Power Characterization Considering Process Variations. PATMOS 2006: 66-74
9EESebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura: Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?. VTS 2006: 358-363
8EESebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura: Impact of Thermal Gradients on Clock Skew and Testing. IEEE Design & Test of Computers 23(5): 414-424 (2006)
2005
7EEJosé Luis Rosselló, Vicens Canals, Sebastià A. Bota, Ali Keshavarzi, Jaume Segura: A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs. DATE 2005: 206-211
6EESebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura: Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. DATE 2005: 464-465
5EEB. Alorda, Sebastià A. Bota, Jaume Segura: A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits. IOLTS 2005: 177-182
4EEJosé Luis Rosselló, Sebastià A. Bota, Jaume Segura: Compact Static Power Model of Complex CMOS Gates. PATMOS 2005: 348-354
2004
3 Raimon Casanova, José Luis Merino, Ángel Dieguez, Sebastià A. Bota, Josep Samitier: A mixed-mode temperature control circuit for gas sensors. ISCAS (4) 2004: 896-909
2EESebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi: Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284
2001
1EEJosé Luis Merino, Sebastià A. Bota, A. Herms, Josep Samitier, Enric Cabruja, X. Jordà, M. Vellvehí, J. Bausells, A. Ferré, J. Bigorr: Smart Temperature Sensor for On-Line Monitoring in Automotive Applications. IOLTW 2001: 122-126

Coauthor Index

1B. Alorda [5]
2J. Bausells [1]
3Carol de Benito [8] [10] [15]
4J. Bigorr [1]
5Enric Cabruja [1]
6Vicens Canals [7] [11] [13]
7X. Cano [14]
8Raimon Casanova [3]
9A. Comerma [14]
10Ángel Dieguez [3]
11A. Ferré [1]
12Eugenio García [12]
13Eugeni García-Moreno [16]
14L. Garrido [14]
15D. Gascón [14]
16R. Graciani [14]
17A. Herms [1] [14]
18Eugeni Isern [12] [16]
19X. Jordà [1]
20Ali Keshavarzi [2] [7] [8] [13]
21José Luis Merino [1] [3]
22Ivan de Paúl [11]
23Rodrigo Picos [12] [16]
24Miquel Roca [12] [16]
25M. Rosales [2] [6] [9]
26José Luis Rosselló [2] [4] [6] [7] [8] [9] [10] [11] [13] [15]
27Josep Samitier [1] [3]
28Jaume Segura [2] [4] [5] [6] [7] [8] [9] [10] [11] [13] [14] [15]
29Kay Suenaga [12] [16]
30M. Vellvehí [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)