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Kunal P. Ganeshpure

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2009
9EEKunal P. Ganeshpure, Ilia Polian, Sandip Kundu, Bernd Becker: Reducing temperature variability by routing heat pipes. ACM Great Lakes Symposium on VLSI 2009: 63-68
8EEKunal P. Ganeshpure, Sandip Kundu: An ILP Based ATPG Technique for Multiple Aggressor Crosstalk Faults Considering the Effects of Gate Delays. VLSI Design 2009: 233-238
7EEAlodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu: An Improved Soft-Error Rate Measurement Technique. IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 596-600 (2009)
2008
6EEAshesh Rastogi, Kunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu: On Composite Leakage Current Maximization. J. Electronic Testing 24(4): 405-420 (2008)
2007
5EEKunal P. Ganeshpure, Sandip Kundu: Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults. DATE 2007: 540-545
4EEAlodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu: Accelerating Soft Error Rate Testing Through Pattern Selection. IOLTS 2007: 191-193
3EEAshesh Rastogi, Kunal P. Ganeshpure, Sandip Kundu: A Study on Impact of Leakage Current on Dynamic Power. ISCAS 2007: 1069-1072
2EEAlodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu: On Accelerating Soft-Error Detection by Targeted Pattern Generation. ISQED 2007: 723-728
2006
1EEKunal P. Ganeshpure, Alodeep Sanyal, Sandip Kundu: A Pattern Generation Technique for Maximizing Power Supply Currents. ICCD 2006

Coauthor Index

1Bernd Becker [9]
2Sandip Kundu [1] [2] [3] [4] [5] [6] [7] [8] [9]
3Ilia Polian [9]
4Ashesh Rastogi [3] [6]
5Alodeep Sanyal [1] [2] [4] [6] [7]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)