| 2007 |
|---|
| 11 | EE | Emmanuel Simeu,
Salvador Mir,
R. Kherreddine,
H. N. Nguyen:
Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches.
IOLTS 2007: 237-243 |
| 10 | EE | Ahcène Bounceur,
Salvador Mir,
Emmanuel Simeu,
Luís Rolíndez:
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing.
J. Electronic Testing 23(6): 471-484 (2007) |
| 2006 |
|---|
| 9 | EE | Ahcène Bounceur,
Salvador Mir,
Luís Rolíndez,
Emmanuel Simeu:
CAT platform for analogue and mixed-signal test evaluation and optimization.
VLSI-SoC 2006: 320-325 |
| 2005 |
|---|
| 8 | EE | Libor Rufer,
Salvador Mir,
Emmanuel Simeu,
C. Domingues:
On-Chip Pseudorandom MEMS Testing.
J. Electronic Testing 21(3): 233-241 (2005) |
| 2003 |
|---|
| 7 | EE | Mohammad A. Naal,
Emmanuel Simeu,
Salvador Mir:
On-Line Testable Decimation Filter Design for AMS Systems.
IOLTS 2003: 83-88 |
| 2002 |
|---|
| 6 | EE | Mohammad A. Naal,
M. Rakotoar,
Emmanuel Simeu,
Chouki Aktouf:
Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach.
IOLTW 2002: 184 |
| 2001 |
|---|
| 5 | EE | Emmanuel Simeu,
Ahmad Abdelhay,
Mohammad A. Naal:
Robust Self Concurrent Test of Linear Digital Systems.
Asian Test Symposium 2001: 293-298 |
| 4 | EE | Emmanuel Simeu,
Ahmad Abdelhay:
A Robust Fault Detection Scheme for Concurrent Testing of Linear Digital Systems.
IOLTW 2001: 209-214 |
| 2000 |
|---|
| 3 | EE | Ahmad Abdelhay,
Emmanuel Simeu:
Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems.
IOLTW 2000: 112- |
| 2 | EE | Mohammad A. Naal,
Emmanuel Simeu:
High-Level Synthesis Methodology for On-Line Testability Optimization.
IOLTW 2000: 201-206 |
| 1999 |
|---|
| 1 | EE | Emmanuel Simeu,
Arno W. Peters,
Iyad Rayane:
Automatic Design of Optimal Concurrent Fault Detector for Linear Analog Systems.
FTCS 1999: 184-191 |
