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John Liobe

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2007
5EEJohn Liobe, Martin Margala: Novel Process and Temperature-Stable BICS for Embedded Analog and Mixed-Signal Test. IOLTS 2007: 231-236
4EERichard Geisler, John Liobe, Martin Margala: Process and Temperature Calibration of PLLs with BiST Capabilities. ISCAS 2007: 3864-3867
2006
3EEQuentin Diduck, John Liobe, Sadeka Ali, Martin Margala: Process tolerant calibration circuit for PLL applications with BIST. ISCAS 2006
2005
2EEMichael Wieckowski, John Liobe, Quentin Diduck, Martin Margala: A New Test Methodology For DNL Error In Flash ADC's. DFT 2005: 582-590
2003
1 Martin Margala, John Liobe, Quentin Diduck: Deep-Submicron CMOS Design Methodology for High-Performance Low-Power Analog-to-Digital Converters. VLSI-SOC 2003: 380-385

Coauthor Index

1Sadeka Ali [3]
2Quentin Diduck [1] [2] [3]
3Richard Geisler [4]
4Martin Margala [1] [2] [3] [4] [5]
5Michael Wieckowski [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)