| 2007 |
|---|
| 4 | EE | Andrea Manuzzato,
Paolo Rech,
Simone Gerardin,
Alessandro Paccagnella,
Luca Sterpone,
Massimo Violante:
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs.
DFT 2007: 79-86 |
| 3 | EE | M. Bagatin,
G. Cellere,
Simone Gerardin,
Alessandro Paccagnella,
A. Visconti,
S. Beltrami,
M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions.
IOLTS 2007: 146-151 |
| 2006 |
|---|
| 2 | EE | Simone Gerardin,
A. Griffoni,
A. Cester,
Alessandro Paccagnella,
G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.
Microelectronics Reliability 46(9-11): 1669-1672 (2006) |
| 1 | EE | Francesca Danesin,
F. Zanon,
Simone Gerardin,
F. Rampazzo,
Gaudenzio Meneghesso,
Enrico Zanoni,
Alessandro Paccagnella:
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.
Microelectronics Reliability 46(9-11): 1750-1753 (2006) |
