Lorena Anghel

2009
28	EE	Hai Yu, Michael Nicolaidis, Lorena Anghel: An effective approach to detect logic soft errors in digital circuits based on GRAAL. ISQED 2009: 236-240
2008
27	EE	Claudia Rusu, Cristian Grecu, Lorena Anghel: Coordinated versus Uncoordinated Checkpoint Recovery for Network-on-Chip Based Systems. DELTA 2008: 32-37
26	EE	Claudia Rusu, Cristian Grecu, Lorena Anghel: Improving the scalability of checkpoint recovery for networks-on-chip. ISCAS 2008: 2793-2796
2007
25	EE	Claudia Rusu, A. Bougerol, Lorena Anghel, C. Weulersse, N. Buard, S. Benhammadi, N. Renaud, G. Hubert, F. Wrobel, T. Carriere, R. Gaillard: Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS 2007: 137-145
24	EE	Cristian Grecu, Lorena Anghel, Partha Pratim Pande, André Ivanov, Resve Saleh: Essential Fault-Tolerance Metrics for NoC Infrastructures. IOLTS 2007: 37-42
23	EE	Lorena Anghel, Michael Nicolaidis: Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies. IWANN 2007: 422-429
22	EE	Cristiano Lazzari, Cristiano Santos, Adriel Ziesemer, Lorena Anghel, Ricardo Reis: Efficient timing closure with a transistor level design flow. VLSI-SoC 2007: 312-315
21	EE	Cristiano Lazzari, Ricardo A. L. Reis, Lorena Anghel: A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis. J. Electronic Testing 23(6): 625-633 (2007)
2006
20	EE	Cristiano Lazzari, Ricardo A. L. Reis, Lorena Anghel: Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis: A Case Study. IOLTS 2006: 165-172
19	EE	G. Hubert, A. Bougerol, F. Miller, N. Buard, Lorena Anghel, T. Carriere, F. Wrobel, R. Gaillard: Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS 2006: 63-74
18	EE	Lorena Anghel, Michael Nicolaidis, Nadine Buard: From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? IOLTS 2006: 85
2005
17	EE	Cristiano Lazzari, Lorena Anghel, Ricardo A. L. Reis: On Implementing a Soft Error Hardening Technique by Using an Automatic Layout Generator: Case Study. IOLTS 2005: 29-34
16	EE	Lorena Anghel, Régis Leveugle, Pierre Vanhauwaert: Evaluation of SET and SEU Effects at Multiple Abstraction Levels. IOLTS 2005: 309-312
15	EE	Lorena Anghel, Michael Nicolaidis: Simulation and Mitigation of Single Event Effects. IOLTS 2005: 81
14	EE	Cristiano Lazzari, Lorena Anghel, Ricardo Reis: A Transistor Placement Technique Using Genetic Algorithm and Analytical Programming. VLSI-SoC 2005: 331-344
13	EE	Michael Nicolaidis, Lorena Anghel, Nadir Achouri: Memory Defect Tolerance Architectures for Nanotechnologies. J. Electronic Testing 21(4): 445-455 (2005)
2004
12	EE	Lorena Anghel, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero, Raoul Velazco: Coupling Different Methodologies to Validate Obsolete Microprocessors. DFT 2004: 250-255
11	EE	Lorena Anghel, Nadir Achouri, Michael Nicolaidis: Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie. PRDC 2004: 315-320
10	EE	Michael Nicolaidis, Nadir Achouri, Lorena Anghel: A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies. VTS 2004: 313-318
9	EE	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: Simulating Single Event Transients in VDSM ICs for Ground Level Radiation. J. Electronic Testing 20(4): 413-421 (2004)
2003
8	EE	Michael Nicolaidis, Nadir Achouri, Lorena Anghel: A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities. DFT 2003: 459-466
7	EE	Lorena Anghel, Raoul Velazco, S. Saleh, S. Deswaertes, A. El Moucary: Preliminary Validation of an Approach Dealing with Processor Obsolescence. DFT 2003: 493-
6	EE	Raoul Velazco, Lorena Anghel, S. Saleh: A Methodology for Test Replacement Solutions of Obsolete Processors. IOLTS 2003: 209-213
5	EE	Michael Nicolaidis, Nadir Achouri, Lorena Anghel: Memory Built-In Self-Repair for Nanotechnologies. IOLTS 2003: 94-
2002
4	EE	Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis: New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs. DFT 2002: 99-107
2000
3	EE	Lorena Anghel, Michael Nicolaidis: Cost Reduction and Evaluation of a Temporary Faults Detecting Technique. DATE 2000: 591-598
2	EE	Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal: Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS 2000: 55-66
1999
1	EE	Th. Calin, Lorena Anghel, Michael Nicolaidis: Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142

Coauthor Index

1	Nadir Achouri	[5] [8] [10] [11] [13]
2	Dan Alexandrescu	[4] [9]
3	Issam Alzaher-Noufal	[2]
4	S. Benhammadi	[25]
5	A. Bougerol	[19] [25]
6	N. Buard	[19] [25]
7	Nadine Buard	[18]
8	Th. Calin	[1]
9	T. Carriere	[19] [25]
10	S. Deswaertes	[7]
11	R. Gaillard	[19] [25]
12	Cristian Grecu	[24] [26] [27]
13	G. Hubert	[19] [25]
14	André Ivanov	[24]
15	Cristiano Lazzari	[14] [17] [20] [21] [22]
16	Régis Leveugle	[16]
17	F. Miller	[19]
18	A. El Moucary	[7]
19	Michael Nicolaidis	[1] [2] [3] [4] [5] [8] [9] [10] [11] [13] [15] [18] [23] [28]
20	Partha Pratim Pande	[24]
21	Ricardo Augusto da Luz Reis (Ricardo A. L. Reis, Ricardo Reis)	[14] [17] [20] [21] [22]
22	N. Renaud	[25]
23	Matteo Sonza Reorda	[12]
24	Claudia Rusu	[25] [26] [27]
25	Resve A. Saleh (Resve Saleh, Res Saleh)	[24]
26	S. Saleh	[6] [7]
27	Ernesto Sánchez (Edgar Ernesto Sánchez Sánchez)	[12]
28	Cristiano Santos	[22]
29	Giovanni Squillero	[12]
30	Pierre Vanhauwaert	[16]
31	Raoul Velazco	[6] [7] [12]
32	C. Weulersse	[25]
33	F. Wrobel	[19] [25]
34	Hai Yu	[28]
35	Adriel Ziesemer	[22]

Colors in the list of coauthors