Ioannis Voyiatzis

2008
17	EE	Ioannis Voyiatzis: An ALU-Based BIST Scheme for Word-Organized RAMs. IEEE Trans. Computers 57(5): 577-590 (2008)
16	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Constantin Halatsis, Frosso S. Makri, Miltiadis Hatzimihail: An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set. IEEE Trans. Computers 57(8): 1012-1022 (2008)
15	EE	Ioannis Voyiatzis: An Accumulator-Based Compaction Scheme For Online BIST of RAMs. IEEE Trans. VLSI Syst. 16(9): 1248-1251 (2008)
2007
14	EE	Ioannis Voyiatzis: Embedding test patterns into Low-Power BIST sequences. IOLTS 2007: 197-198
13	EE	Ioannis Voyiatzis, Dimitris J. Kavvadias, H. Antonopoulou, S. Sinitos: Reliability considerations in mobile devices. MobiMedia 2007: 51
12	EE	Ioannis Voyiatzis: Accumulator-based pseudo-exhaustive two-pattern generation. Journal of Systems Architecture 53(11): 846-860 (2007)
2006
11	EE	Ioannis Voyiatzis, D. Kehagias: A SiC Pair Generator for a Bilbo Environment. Journal of Circuits, Systems, and Computers 15(5): 739-756 (2006)
2005
10	EE	Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-Based Weighted Pattern Generation. IOLTS 2005: 215-220
9	EE	Ioannis Voyiatzis: Test Vector Embedding into Accumulator-Generated Sequences: A Linear-Time Solution. IEEE Trans. Computers 54(4): 476-484 (2005)
8	EE	Ioannis Voyiatzis, Constantin Halatsis: A Low-Cost Concurrent BIST Scheme for Increased Dependability. IEEE Trans. Dependable Sec. Comput. 2(2): 150-156 (2005)
7	EE	Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis: Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time. IEEE Trans. VLSI Syst. 13(9): 1079-1086 (2005)
6	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis: A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Transactions on Reliability 54(1): 69-78 (2005)
2004
5	EE	Ioannis Voyiatzis: A counter-based pseudo-exhaustive pattern generator for BIST applications. Microelectronics Journal 35(11): 927-935 (2004)
1999
4	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis: An Accumulator-Based BIST Approach for Two-Pattern Testing. J. Electronic Testing 15(3): 267-278 (1999)
1998
3	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantinos Halatsis: R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique. ITC 1998: 918-925
1996
2	EE	Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Nikolos, Constantin Halatsis: An efficient built-in self test method for robust path delay fault testing. J. Electronic Testing 8(2): 219-222 (1996)
1995
1	EE	Ioannis Voyiatzis, Dimitris Nikolos, Antonis M. Paschalis, Constantinos Halatsis, Th. Haniotakis: An efficient comparative concurrent Built-In Self-Test technique. Asian Test Symposium 1995: 309-315

Coauthor Index

1	H. Antonopoulou	[13]
2	Dimitris Gizopoulos	[6] [7] [10] [16]
3	Constantin Halatsis (Constantine Halatsis, Constantinos Halatsis)	[1] [2] [3] [4] [6] [8] [16]
4	Themistoklis Haniotakis (Th. Haniotakis)	[1]
5	Miltiadis Hatzimihail	[16]
6	Dimitris J. Kavvadias	[13]
7	D. Kehagias	[11]
8	Nektarios Kranitis	[6]
9	Frosso S. Makri	[16]
10	Dimitris Nikolos	[1] [2] [3] [4]
11	Antonis M. Paschalis	[1] [2] [3] [4] [6] [7] [10] [16]
12	S. Sinitos	[13]

Colors in the list of coauthors