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Heinrich Theodor Vierhaus

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2008
44EESilvio Misera, Heinrich Theodor Vierhaus, André Sieber: Simulated fault injections and their acceleration in SystemC. Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 270-278 (2008)
2007
43 René Kothe, Heinrich Theodor Vierhaus: Flip-Flops and Scan-Path Elements for Nanoelectronics. DDECS 2007: 307-312
42EEHeinrich Theodor Vierhaus, Helmut Rossmann, Silvio Misera: Timing- / Power-Optimization for Digital Logic Based on Standard Cells. DSD 2007: 303-306
41EESilvio Misera, Heinrich Theodor Vierhaus, André Sieber: Fault Injection Techniques and their Accelerated Simulation in SystemC. DSD 2007: 587-595
40EER. Frost Brandenburg, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus: A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284
2006
39 Christian Galke, René Kothe, Heinrich Theodor Vierhaus: Logic Self Repair. ARCS Workshops 2006: 36-44
38EEUdo Krautz, Matthias Pflanz, Christian Jacobi, Hans-Werner Tast, Kai Weber, Heinrich Theodor Vierhaus: Evaluating coverage of error detection logic for soft errors using formal methods. DATE 2006: 176-181
37 René Kothe, Christian Galke, S. Schultke, H. Froeschke, S. Gaede, Heinrich Theodor Vierhaus: Hardware/Software Based Hierarchical Self Test for SoCs. DDECS 2006: 159-160
36 René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube: Embedded Self Repair by Transistor and Gate Level Reconfiguration. DDECS 2006: 210-215
35EESilvio Misera, Heinrich Theodor Vierhaus, Lars Breitenfeld, André Sieber: A Mixed Language Fault Simulation of VHDL and SystemC. DSD 2006: 275-279
34EEChristian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438
33EEChristian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus: Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS 2006: 181-182
32EES. Habermann, René Kothe, Heinrich Theodor Vierhaus: Built-in Self Repair by Reconfiguration of FPGAs. IOLTS 2006: 187-188
2005
31 Heinrich Theodor Vierhaus, Helmut Rossmann: Power-/Timing - Optimierung für Zellen-basierte Digitalschaltungen in Submikron-Technologien. GI Jahrestagung (1) 2005: 339-343
30EERené Kothe, Christian Galke, Heinrich Theodor Vierhaus: A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. IOLTS 2005: 241-246
29EEMarcin Gomulkiewicz, Miroslaw Kutylowski, Heinrich Theodor Vierhaus, Pawel Wlaz: Synchronization Fault Cryptanalysis for Breaking A5/1. WEA 2005: 415-427
2004
28EEClaudia Kretzschmar, Christian Galke, Heinrich Theodor Vierhaus: A Hierarchical Self Test Scheme for SoCs. IOLTS 2004: 37-44
27EESilvio Misera, Heinrich Theodor Vierhaus: FIT - A Parallel Hierarchical Fault Simulation Environment. PARELEC 2004: 289-294
2003
26EEMatthias Pflanz, Heinrich Theodor Vierhaus: Control Signal Protection For High Performance Processors. IOLTS 2003: 173-
25EEChristian Galke, Marcus Grabow, Heinrich Theodor Vierhaus: Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip. IOLTS 2003: 183-
24EEMatthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check. J. Electronic Testing 19(5): 501-510 (2003)
2002
23EEChristian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: A Test Processor Concept for Systems-on-a-Chip. ICCD 2002: 210-
22EEChristian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus: On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. IOLTW 2002: 178
21EEMatthias Pflanz, K. Walther, Christian Galke, Heinrich Theodor Vierhaus: On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. IOLTW 2002: 69-73
2001
20EEC. Rousselle, Matthias Pflanz, A. Behling, T. Mohaupt, Heinrich Theodor Vierhaus: A register-transfer-level fault simulator for permanent and transient faults in embedded processors. DATE 2001: 811
19EEMatthias Pflanz, K. Walther, Heinrich Theodor Vierhaus: On-line Error Detection Techniques for Dependable Embedded Processors with High Complexity. IOLTW 2001: 51-53
18EEMatthias Pflanz, Heinrich Theodor Vierhaus: Online Check and Recovery Techniques for Dependable Embedded Processors. IEEE Micro 21(5): 24-40 (2001)
1999
17 Matthias Pflanz, Heinrich Theodor Vierhaus, F. Pompsch: An efficient on-line-test and back-up scheme for embedded processors. ITC 1999: 964-972
16EEFulvio Corno, Uwe Gläser, Paolo Prinetto, Matteo Sonza Reorda, Heinrich Theodor Vierhaus, Massimo Violante: SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information. IEEE Trans. on CAD of Integrated Circuits and Systems 18(2): 191-202 (1999)
1997
15EEH.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation. Great Lakes Symposium on VLSI 1997: 112-117
14 H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits. PARCO 1997: 549-556
13EEUwe Hübner, Heinrich Theodor Vierhaus, Raul Camposano: Partitioning and analysis of static digital CMOS circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1292-1310 (1997)
1996
12EEJörg Wilberg, A. Kuth, Raul Camposano, Wolfgang Rosenstiel, Heinrich Theodor Vierhaus: A Design Exploration Environment. Great Lakes Symposium on VLSI 1996: 77-80
11 H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor Vierhaus: Automatic Test Pattern Generation with Optimal Load Balancing. PVM 1996: 205-212
10EEUwe Gläser, Heinrich Theodor Vierhaus: Mixed level test generation for synchronous sequential circuits using the FOGBUSTER algorithm. IEEE Trans. on CAD of Integrated Circuits and Systems 15(4): 410-423 (1996)
1995
9EEUwe Gläser, Heinrich Theodor Vierhaus: FOGBUSTER: an efficient algorithm for sequential test generation. EURO-DAC 1995: 230-235
8EEFulvio Corno, Paolo Prinetto, Matteo Sonza Reorda, Uwe Gläser, Heinrich Theodor Vierhaus: Improving topological ATPG with symbolic techniques. VTS 1995: 338-343
1994
7 Michel Langevin, Eduard Cerny, Jörg Wilberg, Heinrich Theodor Vierhaus: Local microcode generation in system design. Code Generation for Embedded Processors 1994: 171-187
6EEUwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold: Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39
5 R. Wolber, Uwe Gläser, Heinrich Theodor Vierhaus: Testability Analysis for Test Generation in Synchronous Sequential Circuits. ICCD 1994: 350-353
1993
4 Heinrich Theodor Vierhaus, Wolfgang Meyer, Uwe Gläser: CMOS Bridges and Resistive Transistor Faults: IDDQ versus Delay Effects. ITC 1993: 83-91
1992
3EEUwe Hübner, Heinrich Theodor Vierhaus: Efficient partitioning and analysis of digital CMOS-circuits. ICCAD 1992: 280-283
2 Ursula Westerholz, Heinrich Theodor Vierhaus: Library Mapping of CMOS-Switch-Level-Circuits by Extraction of Isomorphic Subgraphs. ICCD 1992: 472-475
1 Uwe Gläser, Uwe Hübner, Heinrich Theodor Vierhaus: Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects. ITC 1992: 21-29

Coauthor Index

1A. Behling [20]
2R. Frost Brandenburg [40]
3Lars Breitenfeld [35]
4Raul Camposano [12] [13]
5Eduard Cerny [7]
6Fulvio Corno [8] [16]
7Torsten Coym [36]
8H.-Ch. Dahmen [11] [14] [15]
9H. Froeschke [37]
10S. Gaede [37]
11Christian Galke [21] [22] [23] [24] [25] [28] [30] [33] [34] [37] [39] [40]
12U. Gätzschmann [34]
13Uwe Gläser [1] [4] [5] [6] [8] [9] [10] [11] [14] [15] [16]
14Marcin Gomulkiewicz [29]
15Marcus Grabow [25]
16S. Habermann [32]
17J. Honko [33]
18Uwe Hübner [1] [3] [13]
19Christian Jacobi [38]
20M. Kley [6]
21René Kothe [30] [32] [33] [36] [37] [39] [40] [43]
22Udo Krautz [38]
23Claudia Kretzschmar [28]
24A. Kuth [12]
25Miroslaw Kutylowski [29]
26Michel Langevin [7]
27Wolfgang Meyer [4]
28Silvio Misera [27] [35] [41] [42] [44]
29T. Mohaupt [20]
30Matthias Pflanz [17] [18] [19] [20] [21] [22] [23] [24] [26] [38]
31F. Pompsch [17]
32Paolo Prinetto [8] [16]
33Matteo Sonza Reorda [8] [16]
34Wolfgang Rosenstiel [12]
35Helmut Rossmann [31] [42]
36C. Rousselle [20]
37D. Rudolph [40]
38S. Schultke [33] [37]
39André Sieber [35] [41] [44]
40Bernd Straube [36]
41Hans-Werner Tast [38]
42Wolfgang Vermeiren [36]
43Massimo Violante [16]
44K. Walther [19] [21] [24]
45Kai Weber [38]
46Ursula Westerholz [2]
47A. Wiederhold [6]
48Jörg Wilberg [7] [12]
49K. Winkler [33]
50Pawel Wlaz [29]
51R. Wolber [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)