| |
| 2007 | ||
|---|---|---|
| 5 | EE | Tino Heijmen: Spread in Alpha-Particle-Induced Soft-Error Rate of 90-nm Embedded SRAMs. IOLTS 2007: 131-136 |
| 2006 | ||
| 4 | EE | Tino Heijmen, André Nieuwland: Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. European Test Symposium 2006: 247-252 |
| 3 | EE | Tino Heijmen: Soft Error Rates in Deep-Submicron CMOS Technologies. IOLTS 2006: 271 |
| 2 | EE | Tino Heijmen, Damien Giot, Philippe Roche: Factors That Impact the Critical Charge of Memory Elements. IOLTS 2006: 57-62 |
| 2005 | ||
| 1 | EE | Tino Heijmen: Analytical Semi-Empirical Model for SER Sensitivity Estimation of Deep-Submicron CMOS Circuits. IOLTS 2005: 3-8 |
| 1 | Damien Giot | [2] |
| 2 | André Nieuwland | [4] |
| 3 | Philippe Roche | [2] |