2009 |
15 | EE | Nilanjan Banerjee,
Saumya Chandra,
Swaroop Ghosh,
Sujit Dey,
Anand Raghunathan,
Kaushik Roy:
Coping with Variations through System-Level Design.
VLSI Design 2009: 581-586 |
2008 |
14 | EE | Swaroop Ghosh,
Kaushik Roy:
Exploring high-speed low-power hybrid arithmetic units at scaled supply and adaptive clock-stretching.
ASP-DAC 2008: 635-640 |
13 | EE | Swaroop Ghosh,
Patrick Ndai,
Kaushik Roy:
A Novel Low Overhead Fault Tolerant Kogge-Stone Adder Using Adaptive Clocking.
DATE 2008: 366-371 |
12 | EE | Swaroop Ghosh,
Jung Hwan Choi,
Patrick Ndai,
Kaushik Roy:
O2C: occasional two-cycle operations for dynamic thermal management in high performance in-order microprocessors.
ISLPED 2008: 189-192 |
11 | EE | Jing Li,
Aditya Bansal,
Swaroop Ghosh,
Kaushik Roy:
An alternate design paradigm for low-power, low-cost, testable hybrid systems using scaled LTPS TFTs.
JETC 4(3): (2008) |
2007 |
10 | EE | Swaroop Ghosh,
Swarup Bhunia,
Kaushik Roy:
Low-overhead circuit synthesis for temperature adaptation using dynamic voltage scheduling.
DATE 2007: 1532-1537 |
9 | EE | Swaroop Ghosh,
Patrick Ndai,
Swarup Bhunia,
Kaushik Roy:
Tolerance to Small Delay Defects by Adaptive Clock Stretching.
IOLTS 2007: 244-252 |
8 | EE | Swaroop Ghosh,
Swarup Bhunia,
Kaushik Roy:
Low-Power and testable circuit synthesis using Shannon decomposition.
ACM Trans. Design Autom. Electr. Syst. 12(4): (2007) |
7 | EE | Swaroop Ghosh,
Swarup Bhunia,
Kaushik Roy:
CRISTA: A New Paradigm for Low-Power, Variation-Tolerant, and Adaptive Circuit Synthesis Using Critical Path Isolation.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 1947-1956 (2007) |
2006 |
6 | EE | Swaroop Ghosh,
Saibal Mukhopadhyay,
Kee-Jong Kim,
Kaushik Roy:
Self-calibration technique for reduction of hold failures in low-power nano-scaled SRAM.
DAC 2006: 971-976 |
5 | EE | Swaroop Ghosh,
Swarup Bhunia,
Kaushik Roy:
A new paradigm for low-power, variation-tolerant circuit synthesis using critical path isolation.
ICCAD 2006: 619-624 |
4 | EE | Swaroop Ghosh,
Swarup Bhunia,
Arijit Raychowdhury,
Kaushik Roy:
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor.
IOLTS 2006: 31-36 |
3 | EE | Swaroop Ghosh,
Swarup Bhunia,
Arijit Raychowdhury,
Kaushik Roy:
A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2934-2943 (2006) |
2005 |
2 | EE | Swaroop Ghosh,
Swarup Bhunia,
Kaushik Roy:
Shannon Expansion Based Supply-Gated Logic for Improved Power and Testability.
Asian Test Symposium 2005: 404-409 |
1 | EE | Arijit Raychowdhury,
Swaroop Ghosh,
Kaushik Roy:
A Novel On-Chip Delay Measurement Hardware for Efficient Speed-Binning.
IOLTS 2005: 287-292 |