2007 |
12 | EE | R. Frost Brandenburg,
D. Rudolph,
Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture.
IOLTS 2007: 277-284 |
2006 |
11 | | Christian Galke,
René Kothe,
Heinrich Theodor Vierhaus:
Logic Self Repair.
ARCS Workshops 2006: 36-44 |
10 | | René Kothe,
Christian Galke,
S. Schultke,
H. Froeschke,
S. Gaede,
Heinrich Theodor Vierhaus:
Hardware/Software Based Hierarchical Self Test for SoCs.
DDECS 2006: 159-160 |
9 | EE | Christian Galke,
U. Gätzschmann,
Heinrich Theodor Vierhaus:
Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes.
DSD 2006: 433-438 |
8 | EE | Christian Galke,
René Kothe,
S. Schultke,
K. Winkler,
J. Honko,
Heinrich Theodor Vierhaus:
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.
IOLTS 2006: 181-182 |
2005 |
7 | EE | René Kothe,
Christian Galke,
Heinrich Theodor Vierhaus:
A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features.
IOLTS 2005: 241-246 |
2004 |
6 | EE | Claudia Kretzschmar,
Christian Galke,
Heinrich Theodor Vierhaus:
A Hierarchical Self Test Scheme for SoCs.
IOLTS 2004: 37-44 |
2003 |
5 | EE | Christian Galke,
Marcus Grabow,
Heinrich Theodor Vierhaus:
Perspectives of Combining on-line and off-line Test Technology for Dependable Systems on a Chip.
IOLTS 2003: 183- |
4 | EE | Matthias Pflanz,
K. Walther,
Christian Galke,
Heinrich Theodor Vierhaus:
On-Line Techniques for Error Detection and Correction in Processor Registers with Cross-Parity Check.
J. Electronic Testing 19(5): 501-510 (2003) |
2002 |
3 | EE | Christian Galke,
Matthias Pflanz,
Heinrich Theodor Vierhaus:
A Test Processor Concept for Systems-on-a-Chip.
ICCD 2002: 210- |
2 | EE | Christian Galke,
Matthias Pflanz,
Heinrich Theodor Vierhaus:
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures.
IOLTW 2002: 178 |
1 | EE | Matthias Pflanz,
K. Walther,
Christian Galke,
Heinrich Theodor Vierhaus:
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check.
IOLTW 2002: 69-73 |