| 2001 |
|---|
| 6 | EE | Mani Soma,
Sam D. Huynh,
Jinyan Zhang,
Seongwon Kim,
Giri Devarayanadurg:
Hierarchical ATPG for Analog Circuits and Systems.
IEEE Design & Test of Computers 18(1): 72-81 (2001) |
| 1999 |
|---|
| 5 | EE | Sam D. Huynh,
Jinyan Zhang,
Seongwon Kim,
Giri Devarayanadurg,
Mani Soma:
Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems.
Asian Test Symposium 1999: 239- |
| 4 | EE | Jinyan Zhang,
Sam D. Huynh,
Mani Soma:
A Test Point Insertion Algorithm for Mixed-Signal Circuits.
VTS 1999: 319-325 |
| 3 | EE | Giri Devarayanadurg,
Mani Soma,
Prashant Goteti,
Sam D. Huynh:
Test set selection for structural faults in analog IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(7): 1026-1039 (1999) |
| 1998 |
|---|
| 2 | EE | Sam D. Huynh,
Seongwon Kim,
Mani Soma,
Jinyan Zhang:
Dynamic Test Set Generation for Analog Circuits and Systems.
Asian Test Symposium 1998: 360-365 |
| 1 | EE | Sam D. Huynh,
Seongwon Kim,
Mani Soma,
Jinyan Zhang:
Testability analysis and multi-frequency ATPG for analog circuits and systems.
ICCAD 1998: 376-383 |
