| 2000 |
|---|
| 4 | | Sudhakar M. Reddy,
Irith Pomeranz,
Seiji Kajihara,
Atsushi Murakami,
Sadami Takeoka,
Mitsuyasu Ohta:
On validating data hold times for flip-flops in sequential circuits.
ITC 2000: 317-325 |
| 3 | | Atsushi Murakami,
Seiji Kajihara,
Tsutomu Sasao,
Irith Pomeranz,
Sudhakar M. Reddy:
Selection of potentially testable path delay faults for test generation.
ITC 2000: 376-384 |
| 1999 |
|---|
| 2 | EE | Seiji Kajihara,
Atsushi Murakami,
Tomohisa Kaneko:
On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits.
Asian Test Symposium 1999: 20-24 |
| 1986 |
|---|
| 1 | | T. Noguchi,
Atsushi Murakami,
Masato Kawai,
Y. Hayasaka:
Testing for a Solid-State Color Image Sensor.
ITC 1986: 683-687 |
