Serge N. Demidenko

2008
20	EE	Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko: Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. DELTA 2008: 216-221
2006
19	EE	Serge N. Demidenko, Victor Lai: Industry-Academia Collaboration in Undergraduate Test Engineering Unit Development. DELTA 2006: 116-122
18	EE	Serge N. Demidenko, Wayne Moorhead: Electronic Test Technology Curriculum Revisiting. DELTA 2006: 129-136
17	EE	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. IEEE Design & Test of Computers 23(2): 88-98 (2006)
2005
16	EE	Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko: Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. Asian Test Symposium 2005: 472
2004
15	EE	Donald Bailey, Warwick Allen, Serge N. Demidenko: Spectral Warping Revisited. DELTA 2004: 23-28
2003
14	EE	W. P. M. Allen, D. G. Bailey, Serge N. Demidenko, Vincenzo Piuri: Analysis and application of digital spectral warping in analog and mixed-signal testing. IEEE Transactions on Reliability 52(4): 444-457 (2003)
2002
13	EE	Wayne Moorhead, Serge N. Demidenko: Making ATE Accessible for Academic Institutions. DELTA 2002: 219-222
12	EE	R. Browne, Serge N. Demidenko, R. O'Driscoll: Harnessing Geographically Distributed Cooperation in Microtechnology Course at Massey University. DELTA 2002: 250-256
11	EE	Serge N. Demidenko, Rauf Kh. Sadykhov, Alexey N. Klimovich, Leonid P. Podenok, Maxim E. Vatkin: Neural Networks to Solve the Problems of Control and Identification. DELTA 2002: 318-320
10	EE	Warwick Allen, Donald Bailey, Serge N. Demidenko, Vincenzo Piuri: Test Chirp Signal Generation Using Spectral Warping. DELTA 2002: 492-495
9	EE	Serge N. Demidenko, Vincenzo Piuri: Concurrent diagnosis in digital implementations of neural networks. Neurocomputing 48(1-4): 879-903 (2002)
2001
8	EE	Serge N. Demidenko, A. J. van de Goor, S. Henderson, P. Knoppers: Simulation and Development of Short Transparent Tests for RAM. Asian Test Symposium 2001: 164-
2000
7	EE	Serge N. Demidenko, Eugene M. Levine, Vincenzo Piuri: Synthesis of On-Line Testing Control Units: Flow Graph Coding/Monitoring Approach. DFT 2000: 266-274
6	EE	Serge N. Demidenko: Guest Editorial. J. Electronic Testing 16(5): 407-408 (2000)
1999
5	EE	Serge N. Demidenko, Kenneth V. Lever: Accelerating Test Data Processin. Asian Test Symposium 1999: 113-
1998
4	EE	Vyacheslav N. Yarmolik, Yuri V. Klimets, Serge N. Demidenko: March PS(23N) Test for DRAM Pattern-Sensitive Faults. Asian Test Symposium 1998: 354-
3	EE	Serge N. Demidenko, Vincenzo Piuri, Vyacheslav N. Yarmolik, A. Shmidman: BIST Module for Mixed-Signal Circuits. DFT 1998: 349-
1996
2	EE	Serge N. Demidenko, Vincenzo Piuri: On-Line Testing In Digital Neural Networks. Asian Test Symposium 1996: 295-
1995
1	EE	Serge N. Demidenko, Alexander Ivanyukovich, Leonid Makhist, Vincenzo Piuri: Error masking in compact testing based on the Hamming code and its modifications. Asian Test Symposium 1995: 303-

Coauthor Index

1	W. P. M. Allen	[14]
2	Warwick Allen	[10] [15]
3	D. G. Bailey	[14]
4	Donald Bailey	[10] [15]
5	R. Browne	[12]
6	Chris Chan	[20]
7	A. J. van de Goor	[8]
8	S. Henderson	[8]
9	Alexander Ivanyukovich	[1]
10	Zainal Abu Kassim	[16] [17]
11	Yuri V. Klimets	[4]
12	Alexey N. Klimovich	[11]
13	P. Knoppers	[8]
14	Ye Chow Kuang	[20]
15	Victor Lai	[19]
16	Kenneth V. Lever	[5]
17	Eugene M. Levine	[7]
18	Leonid Makhist	[1]
19	Wayne Moorhead	[13] [18]
20	R. O'Driscoll	[12]
21	Melanie Po-Leen Ooi	[16] [17] [20]
22	Vincenzo Piuri	[1] [2] [3] [7] [9] [10] [14]
23	Leonid P. Podenok	[11]
24	Rauf Kh. Sadykhov	[11]
25	A. Shmidman	[3]
26	Maxim E. Vatkin	[11]
27	Vyacheslav N. Yarmolik	[3] [4]
28	Mohd Fairuz Zakaria	[16] [17]

Colors in the list of coauthors