1999 | ||
---|---|---|
3 | EE | Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone: Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999: 383-388 |
2 | EE | Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone: Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999: 394- |
1997 | ||
1 | EE | Kiyoshi Nikawa, Shoji Inoue: New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. Asian Test Symposium 1997: 214- |
1 | Kazuyuki Morimoto | [2] [3] |
2 | Kiyoshi Nikawa | [1] [2] [3] |
3 | Shinya Sone | [2] [3] |