Tomohisa Sczaki
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1999
1
EE
Junichi Hirase
,
Shinichi Yoshimura
, Tomohisa Sczaki: Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors.
Asian Test Symposium 1999
: 13-19
Coauthor
Index
1
Junichi Hirase
[
1
]
2
Shinichi Yoshimura
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)