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Tomohisa Sczaki

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1999
1EEJunichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki: Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors. Asian Test Symposium 1999: 13-19

Coauthor Index

1Junichi Hirase [1]
2Shinichi Yoshimura [1]

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