Tomohisa Kaneko

List of publications from the DBLP Bibliography Server - FAQ

1999

1 EE Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko: On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. Asian Test Symposium 1999: 20-24

1999
1	EE	Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko: On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. Asian Test Symposium 1999: 20-24

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