| |
| 1999 | ||
|---|---|---|
| 5 | EE | Xinghao Chen, Thomas J. Snethen, Joe Swenton, Ron Walther: A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor. Asian Test Symposium 1999: 321-326 |
| 1996 | ||
| 4 | EE | Xinghao Chen, Michael L. Bushnell: Sequential circuit test generation using dynamic justification equivalence. J. Electronic Testing 8(1): 9-33 (1996) |
| 1995 | ||
| 3 | EE | Xinghao Chen, Michael L. Bushnell: Generation of search state equivalence for automatic test pattern generation. VLSI Design 1995: 99-103 |
| 1994 | ||
| 2 | Xinghao Chen, Michael L. Bushnell: Dynamic State and Objective Learning for Sequential Circuit Automatic Test Generation Using Decomposition Equivalence. FTCS 1994: 446-455 | |
| 1988 | ||
| 1 | EE | Xinghao Chen, Michael L. Bushnell: A Module Area Estimator for VLSI Layout. DAC 1988: 54-59 |
| 1 | Michael L. Bushnell | [1] [2] [3] [4] |
| 2 | Thomas J. Snethen | [5] |
| 3 | Joe Swenton | [5] |
| 4 | Ron Walther | [5] |