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Seongwon Kim

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2001
6 Seongwon Kim, Mani Soma: Test evaluation and data on defect-oriented BIST architecture for high-speed PLL. ITC 2001: 830-837
5EEMani Soma, Sam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg: Hierarchical ATPG for Analog Circuits and Systems. IEEE Design & Test of Computers 18(1): 72-81 (2001)
2000
4EESeongwon Kim, Mani Soma, Dilip Risbud: An Effective Defect-Oriented BIST Architecture for High-Speed Phase-Locked Loops. VTS 2000: 231-236
1999
3EESam D. Huynh, Jinyan Zhang, Seongwon Kim, Giri Devarayanadurg, Mani Soma: Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. Asian Test Symposium 1999: 239-
1998
2EESam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang: Dynamic Test Set Generation for Analog Circuits and Systems. Asian Test Symposium 1998: 360-365
1EESam D. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang: Testability analysis and multi-frequency ATPG for analog circuits and systems. ICCAD 1998: 376-383

Coauthor Index

1Giri Devarayanadurg [3] [5]
2Sam D. Huynh [1] [2] [3] [5]
3Dilip Risbud [4]
4Mani Soma [1] [2] [3] [4] [5] [6]
5Jinyan Zhang [1] [2] [3] [5]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)