2003 |
6 | EE | Katsuyoshi Miura,
Tomoyuki Kobatake,
Koji Nakamae,
Hiromu Fujioka:
A low energy FIB processing, repair, and test system.
Microelectronics Reliability 43(9-11): 1627-1631 (2003) |
2002 |
5 | EE | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
CAD navigation system, for backside waveform probing of CMOS devices.
Microelectronics Reliability 42(9-11): 1679-1684 (2002) |
2001 |
4 | | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Development of an EB/FIB Integrated Test System.
Microelectronics Reliability 41(9-10): 1489-1494 (2001) |
1999 |
3 | EE | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Intelligent EB Test System for Automatic VLSI Fault Tracing.
Asian Test Symposium 1999: 335-341 |
1997 |
2 | EE | Katsuyoshi Miura,
Kohei Nakata,
Koji Nakamae,
Hiromu Fujioka:
Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.
Asian Test Symposium 1997: 162-167 |
1 | EE | Katsuyoshi Miura,
Koji Nakamae,
Hiromu Fujioka:
Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.
J. Electronic Testing 10(3): 255-269 (1997) |