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Katsuyoshi Miura

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2003
6EEKatsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka: A low energy FIB processing, repair, and test system. Microelectronics Reliability 43(9-11): 1627-1631 (2003)
2002
5EEKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka: CAD navigation system, for backside waveform probing of CMOS devices. Microelectronics Reliability 42(9-11): 1679-1684 (2002)
2001
4 Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka: Development of an EB/FIB Integrated Test System. Microelectronics Reliability 41(9-10): 1489-1494 (2001)
1999
3EEKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka: Intelligent EB Test System for Automatic VLSI Fault Tracing. Asian Test Symposium 1999: 335-341
1997
2EEKatsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka: Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. Asian Test Symposium 1997: 162-167
1EEKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka: Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System. J. Electronic Testing 10(3): 255-269 (1997)

Coauthor Index

1Hiromu Fujioka [1] [2] [3] [4] [5] [6]
2Tomoyuki Kobatake [6]
3Koji Nakamae [1] [2] [3] [4] [5] [6]
4Kohei Nakata [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)