M. H. Konijnenburg
List of publications from the
2006 |
12 | EE | Xinyue Fan,
Will Moore,
Camelia Hora,
Mario H. Konijnenburg,
Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS 2006: 266-271 |
1999 |
11 | EE | Mario H. Konijnenburg,
Hans van der Linden,
A. J. van de Goor:
Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation.
Asian Test Symposium 1999: 185-191 |
10 | EE | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Illegal State Space Identification for Sequential Circuit Test Generation.
DATE 1999: 741-746 |
9 | | Mario H. Konijnenburg,
Hans van der Linden,
Jeroen Geuzebroek:
Benchmarking DAT with the ITC'99 ATPG Benchmarks.
ITC 1999: 1127 |
8 | | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Testability of the Philips 80C51 micro-controller.
ITC 1999: 820-829 |
1998 |
7 | EE | J. Th. van der Linden,
M. H. Konijnenburg,
A. J. van de Goor:
Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection.
Asian Test Symposium 1998: 212- |
1997 |
6 | | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Sequential Test Generation with Advanced Illegal State Search.
ITC 1997: 733-742 |
1996 |
5 | EE | J. Th. van der Linden,
M. H. Konijnenburg,
A. J. van de Goor:
Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors.
Asian Test Symposium 1996: 29-33 |
4 | | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Accelerated Compact Test Set Generation for Three-State Circuits.
ITC 1996: 29-38 |
1995 |
3 | EE | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Compact test sets for industrial circuits.
VTS 1995: 358-366 |
1994 |
2 | | J. Th. van der Linden,
M. H. Konijnenburg,
A. J. van de Goor:
Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O.
ITC 1994: 604-613 |
1993 |
1 | | M. H. Konijnenburg,
J. Th. van der Linden,
A. J. van de Goor:
Test Pattern Generation with Restrictors.
ITC 1993: 598-605 |