M. H. Konijnenburg
List of publications from the DBLP Bibliography Server - FAQ
2006 | ||
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12 | EE | Xinyue Fan, Will Moore, Camelia Hora, Mario H. Konijnenburg, Guido Gronthoud: A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. VTS 2006: 266-271 |
1999 | ||
11 | EE | Mario H. Konijnenburg, Hans van der Linden, A. J. van de Goor: Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. Asian Test Symposium 1999: 185-191 |
10 | EE | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Illegal State Space Identification for Sequential Circuit Test Generation. DATE 1999: 741-746 |
9 | Mario H. Konijnenburg, Hans van der Linden, Jeroen Geuzebroek: Benchmarking DAT with the ITC'99 ATPG Benchmarks. ITC 1999: 1127 | |
8 | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Testability of the Philips 80C51 micro-controller. ITC 1999: 820-829 | |
1998 | ||
7 | EE | J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor: Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection. Asian Test Symposium 1998: 212- |
1997 | ||
6 | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Sequential Test Generation with Advanced Illegal State Search. ITC 1997: 733-742 | |
1996 | ||
5 | EE | J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor: Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. Asian Test Symposium 1996: 29-33 |
4 | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Accelerated Compact Test Set Generation for Three-State Circuits. ITC 1996: 29-38 | |
1995 | ||
3 | EE | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Compact test sets for industrial circuits. VTS 1995: 358-366 |
1994 | ||
2 | J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor: Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. ITC 1994: 604-613 | |
1993 | ||
1 | M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor: Test Pattern Generation with Restrictors. ITC 1993: 598-605 |
1 | Xinyue Fan | [12] |
2 | Jeroen Geuzebroek | [9] |
3 | A. J. van de Goor | [1] [2] [3] [4] [5] [6] [7] [8] [10] [11] |
4 | Guido Gronthoud | [12] |
5 | Camelia Hora | [12] |
6 | Hans van der Linden | [9] [11] |
7 | J. Th. van der Linden | [1] [2] [3] [4] [5] [6] [7] [8] [10] |
8 | Will Moore | [12] |