| 2003 |
|---|
| 4 | EE | Takaki Yoshida,
Masafumi Watari:
A New Approach for Low Power Scan Testing.
ITC 2003: 480-487 |
| 2002 |
|---|
| 3 | EE | Takaki Yoshida,
Masafumi Watari:
MD-SCAN Method for Low Power Scan Testing.
Asian Test Symposium 2002: 80-85 |
| 1999 |
|---|
| 2 | EE | Reisuke Shimoda,
Takaki Yoshida,
Masafumi Watari,
Yasuhiro Toyota,
Kiyokazu Nishi,
Akira Motohara:
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits.
Asian Test Symposium 1999: 347- |
| 1997 |
|---|
| 1 | EE | Takaki Yoshida,
Reisuke Shimoda,
Takashi Mizokawa,
Katsuhiro Hirayama:
An effective fault simulation method for core based LSI.
Asian Test Symposium 1997: 116-121 |
