1999 | ||
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2 | EE | Zhide Zeng, Jihua Chen, Pengxia Liu: A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. Asian Test Symposium 1999: 133- |
1 | EE | Zhide Zeng, Jihua Chen, Hefeng Cao: Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. Asian Test Symposium 1999: 70-74 |
1 | Hefeng Cao | [1] |
2 | Jihua Chen | [1] [2] |
3 | Pengxia Liu | [2] |