![]() |
| 1999 | ||
|---|---|---|
| 2 | EE | Zhide Zeng, Jihua Chen, Pengxia Liu: A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. Asian Test Symposium 1999: 133- |
| 1 | EE | Zhide Zeng, Jihua Chen, Hefeng Cao: Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. Asian Test Symposium 1999: 70-74 |
| 1 | Hefeng Cao | [1] |
| 2 | Jihua Chen | [1] [2] |
| 3 | Pengxia Liu | [2] |