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Zhide Zeng

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1999
2EEZhide Zeng, Jihua Chen, Pengxia Liu: A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. Asian Test Symposium 1999: 133-
1EEZhide Zeng, Jihua Chen, Hefeng Cao: Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. Asian Test Symposium 1999: 70-74

Coauthor Index

1Hefeng Cao [1]
2Jihua Chen [1] [2]
3Pengxia Liu [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)