| 1999 |
|---|
| 5 | EE | Hiroshi Takahashi,
Kwame Osei Boateng,
Yuzo Takamatsu,
Nobuhiro Yanagida:
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.
Asian Test Symposium 1999: 341-346 |
| 1998 |
|---|
| 4 | EE | Nobuhiro Yanagida,
Hiroshi Takahashi,
Yuzo Takamatsu:
Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths.
Asian Test Symposium 1998: 237- |
| 1996 |
|---|
| 3 | | Nobuhiro Yanagida,
Hiroshi Takahashi,
Yuzo Takamatsu:
Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs.
FTCS 1996: 86-95 |
| 1995 |
|---|
| 2 | EE | Hiroshi Takahashi,
Nobuhiro Yanagida,
Yuzo Takamatsu:
Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing.
Asian Test Symposium 1995: 58-64 |
| 1 | EE | Nobuhiro Yanagida,
Hiroshi Takahashi,
Yuzo Takamatsu:
Multiple Fault Diagnosis by Sensitizing Input Pairs.
IEEE Design & Test of Computers 12(3): 44-52 (1995) |
