| |
| 2004 | ||
|---|---|---|
| 4 | EE | Kiyoshi Nikawa: How long can we succeed using the OBIRCH and its derivatives ?. ITC 2004: 1443 |
| 1999 | ||
| 3 | EE | Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone: Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999: 383-388 |
| 2 | EE | Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone: Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999: 394- |
| 1997 | ||
| 1 | EE | Kiyoshi Nikawa, Shoji Inoue: New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. Asian Test Symposium 1997: 214- |
| 1 | Shoji Inoue | [1] [2] [3] |
| 2 | Kazuyuki Morimoto | [2] [3] |
| 3 | Shinya Sone | [2] [3] |