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2003 | ||
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3 | EE | Zhongwei Xu, Bangxing Chen: Damage Size and Software Safety Demonstration Stress Testing. Asian Test Symposium 2003: 509 |
1999 | ||
2 | EE | Zhongwei Xu, Fangmei Wu: A Novel Testing Approach for Safety-Critical Software. Asian Test Symposium 1999: 251-255 |
1 | EE | Weiwei Li, Zhongwei Xu, Yan Jin: An Approach for Testing Safety-Critical Software. Great Lakes Symposium on VLSI 1999: 180-183 |
1 | Bangxing Chen | [3] |
2 | Yan Jin | [1] |
3 | Weiwei Li | [1] |
4 | Fangmei Wu | [2] |