| 2009 |
|---|
| 9 | EE | Koji Yamazaki,
Toshiyuki Tsutsumi,
Hiroshi Takahashi,
Yoshinobu Higami,
Takashi Aikyo,
Yuzo Takamatsu,
Hiroyuki Yotsuyanagi,
Masaki Hashizume:
A Novel Approach for Improving the Quality of Open Fault Diagnosis.
VLSI Design 2009: 85-90 |
| 8 | EE | Hiroyuki Yotsuyanagi,
Masaki Hashizume,
Toshiyuki Tsutsumi,
Koji Yamazaki,
Takashi Aikyo,
Yoshinobu Higami,
Hiroshi Takahashi,
Yuzo Takamatsu:
Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC.
VLSI Design 2009: 91-96 |
| 2008 |
|---|
| 7 | EE | Koji Yamazaki,
Yuzo Takamatsu:
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information.
IEICE Transactions 91-D(3): 661-666 (2008) |
| 6 | EE | Yuzo Takamatsu,
Hiroshi Takahashi,
Yoshinobu Higami,
Takashi Aikyo,
Koji Yamazaki:
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information.
IEICE Transactions 91-D(3): 675-682 (2008) |
| 5 | EE | Hiroshi Takahashi,
Yoshinobu Higami,
Shuhei Kadoyama,
Yuzo Takamatsu,
Koji Yamazaki,
Takashi Aikyo,
Yasuo Sato:
Post-BIST Fault Diagnosis for Multiple Faults.
IEICE Transactions 91-D(3): 771-775 (2008) |
| 2006 |
|---|
| 4 | EE | Hiroshi Takahashi,
Shuhei Kadoyama,
Yoshinobu Higami,
Yuzo Takamatsu,
Koji Yamazaki,
Takashi Aikyo,
Yasuo Sato:
Effective Post-BIST Fault Diagnosis for Multiple Faults.
DFT 2006: 401-109 |
| 1999 |
|---|
| 3 | EE | Teruhiko Yamada,
Toshinori Kotake,
Hiroshi Takahashi,
Koji Yamazaki:
Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset.
Asian Test Symposium 1999: 269-274 |
| 1997 |
|---|
| 2 | EE | Koji Yamazaki,
Teruhiko Yamada:
An approach to diagnose logical faults in partially observable sequential circuits.
Asian Test Symposium 1997: 168-173 |
| 1995 |
|---|
| 1 | EE | Teruhiko Yamada,
Koji Yamazaki,
Edward J. McCluskey:
A simple technique for locating gate-level faults in combinational circuits.
Asian Test Symposium 1995: 65-70 |
