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1999 | ||
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2 | EE | Mario H. Konijnenburg, Hans van der Linden, A. J. van de Goor: Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. Asian Test Symposium 1999: 185-191 |
1 | Mario H. Konijnenburg, Hans van der Linden, Jeroen Geuzebroek: Benchmarking DAT with the ITC'99 ATPG Benchmarks. ITC 1999: 1127 |
1 | Jeroen Geuzebroek | [1] |
2 | A. J. van de Goor | [2] |
3 | Mario H. Konijnenburg (M. H. Konijnenburg) | [1] [2] |