Hans van der Linden

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2EEMario H. Konijnenburg, Hans van der Linden, A. J. van de Goor: Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. Asian Test Symposium 1999: 185-191
1 Mario H. Konijnenburg, Hans van der Linden, Jeroen Geuzebroek: Benchmarking DAT with the ITC'99 ATPG Benchmarks. ITC 1999: 1127

Coauthor Index

1Jeroen Geuzebroek [1]
2A. J. van de Goor [2]
3Mario H. Konijnenburg (M. H. Konijnenburg) [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)