| 2001 |
|---|
| 6 | EE | Bernd Könemann,
Carl Barnhart,
Brion L. Keller,
Thomas J. Snethen,
Owen Farnsworth,
Donald L. Wheater:
A SmartBIST Variant with Guaranteed Encoding.
Asian Test Symposium 2001: 325- |
| 1999 |
|---|
| 5 | EE | Xinghao Chen,
Thomas J. Snethen,
Joe Swenton,
Ron Walther:
A Simplified Method for Testing the IBM Pipeline Partial-Scan Microprocessor.
Asian Test Symposium 1999: 321-326 |
| 1998 |
|---|
| 4 | EE | Mary P. Kusko,
Bryan J. Robbins,
Thomas J. Snethen,
Peilin Song,
Thomas G. Foote,
William V. Huott:
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
ITC 1998: 717-726 |
| 1997 |
|---|
| 3 | EE | William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko,
Stephen Pateras,
Dale E. Hoffman,
Timothy G. McNamara,
Thomas J. Snethen:
Advanced microprocessor test strategy and methodology.
IBM Journal of Research and Development 41(4&5): 611-628 (1997) |
| 1996 |
|---|
| 2 | EE | Rohit Kapur,
Srinivas Patil,
Thomas J. Snethen,
Thomas W. Williams:
A weighted random pattern test generation system.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996) |
| 1994 |
|---|
| 1 | | Rohit Kapur,
Srinivas Patil,
Thomas J. Snethen,
Thomas W. Williams:
Design of an Efficient Weighted-Random-Pattern Generation System.
ITC 1994: 491-500 |
