| 2000 |
|---|
| 4 | EE | Frank Mayer,
Albrecht P. Stroele:
A Versatile BIST Technique Combining Test Registers and Accumulators.
VLSI Design 2000: 412- |
| 1999 |
|---|
| 3 | EE | Albrecht P. Stroele,
Frank Mayer:
Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators.
Asian Test Symposium 1999: 101-106 |
| 1998 |
|---|
| 2 | EE | Frank Mayer,
Albrecht P. Stroele:
Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit.
Asian Test Symposium 1998: 15-20 |
| 1997 |
|---|
| 1 | EE | Albrecht P. Stroele,
Frank Mayer:
Methods to reduce test application time for accumulator-based self-test.
VTS 1997: 48-53 |
