| |
| 2000 | ||
|---|---|---|
| 4 | EE | Frank Mayer, Albrecht P. Stroele: A Versatile BIST Technique Combining Test Registers and Accumulators. VLSI Design 2000: 412- |
| 1999 | ||
| 3 | EE | Albrecht P. Stroele, Frank Mayer: Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators. Asian Test Symposium 1999: 101-106 |
| 1998 | ||
| 2 | EE | Frank Mayer, Albrecht P. Stroele: Configuring Arithmetic Pattern Generators and Response Compactors from the RT-Modules of a Circuit. Asian Test Symposium 1998: 15-20 |
| 1997 | ||
| 1 | EE | Albrecht P. Stroele, Frank Mayer: Methods to reduce test application time for accumulator-based self-test. VTS 1997: 48-53 |
| 1 | Albrecht P. Stroele | [1] [2] [3] [4] |