David San Segundo Bello
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2001
1
EE
David San Segundo Bello,
Ronald J. W. T. Tangelder
,
Hans G. Kerkhoff
: Modeling a Verification Test System for Mixed-Signal Circuits.
IEEE Design & Test of Computers 18
(1): 63-71 (2001)
Coauthor
Index
1
Hans G. Kerkhoff
[
1
]
2
Ronald J. W. T. Tangelder
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
