Corbet S. Johnson
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2001
1
EE
Jien-Chung Lo
,
William D. Armitage
, Corbet S. Johnson: Using Atomic Force Microscopy for Deep-Submicron Failure Analysis.
IEEE Design & Test of Computers 18
(1): 10-18 (2001)
Coauthor
Index
1
William D. Armitage
[
1
]
2
Jien-Chung Lo
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
