| 2002 |
|---|
| 7 | EE | V. A. Zivkovic,
Ronald J. W. T. Tangelder,
Hans G. Kerkhoff:
An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures.
J. Electronic Testing 18(2): 203-212 (2002) |
| 2001 |
|---|
| 6 | EE | David San Segundo Bello,
Ronald J. W. T. Tangelder,
Hans G. Kerkhoff:
Modeling a Verification Test System for Mixed-Signal Circuits.
IEEE Design & Test of Computers 18(1): 63-71 (2001) |
| 2000 |
|---|
| 5 | EE | V. A. Zivkovic,
Ronald J. W. T. Tangelder,
Hans G. Kerkhoff:
Design and Test Space Exploration of Transport-Triggered Architectures.
DATE 2000: 146- |
| 1999 |
|---|
| 4 | EE | Chris Feige,
Jan Ten Pierick,
Clemens Wouters,
Ronald J. W. T. Tangelder,
Hans G. Kerkhoff:
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.
J. Electronic Testing 14(1-2): 125-131 (1999) |
| 3 | EE | Richard Rosing,
Hans G. Kerkhoff,
Ronald J. W. T. Tangelder,
Manoj Sachdev:
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters.
J. Electronic Testing 14(1-2): 67-74 (1999) |
| 2 | EE | Nur Engin,
Hans G. Kerkhoff,
Ronald J. W. T. Tangelder,
Han Speek:
Integrated Design and Test of Mixed-Signal Circuits.
J. Electronic Testing 14(1-2): 75-83 (1999) |
| 1997 |
|---|
| 1 | EE | Ronald J. W. T. Tangelder,
G. Diemel,
Hans G. Kerkhoff:
Smart sensor system application: an integrated compass.
ED&TC 1997: 195-199 |
