| |
| 2002 | ||
|---|---|---|
| 5 | EE | Alvin Jee: Defect-Oriented Analysis of Memory BIST Tests. IOLTW 2002: 201-205 |
| 4 | EE | Mark Craig, Alvin Jee, Prashant Maniar: An Integrated Approach to Yield Loss Characterization. ITC 2002: 350-356 |
| 3 | EE | Alvin Jee: Defect-Oriented Analysis of Memory BIST Tests. MTDT 2002: 7-11 |
| 2001 | ||
| 2 | EE | Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu: Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Design & Test of Computers 18(3): 28-39 (2001) |
| 2000 | ||
| 1 | EE | Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri: Optimizing Memory Tests by Analyzing Defect Coverage. MTDT 2000: 20-28 |
| 1 | Ben Chu | [2] |
| 2 | Jonathon E. Colburn | [1] |
| 3 | Mark Craig | [4] |
| 4 | V. Swamy Irrinki | [1] |
| 5 | David Y. Lepejian | [2] |
| 6 | Prashant Maniar | [4] |
| 7 | Mukesh Puri | [1] |
| 8 | Julie Segal | [2] |