![]() |
| 2001 | ||
|---|---|---|
| 2 | EE | Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001) |
| 1999 | ||
| 1 | EE | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274 |
| 1 | Hari Balachandran | [1] |
| 2 | Kenneth M. Butler | [1] [2] |
| 3 | Jennifer Dworak | [1] [2] |
| 4 | Michael R. Grimaila | [1] [2] |
| 5 | Bryan Houchins | [1] |
| 6 | Sooryong Lee | [1] [2] |
| 7 | Vineet Mathur | [1] |
| 8 | M. Ray Mercer | [1] [2] |
| 9 | Jaehong Park | [1] |
| 10 | Li-C. Wang | [1] [2] |
| 11 | Jason D. Wicker | [2] |