2001 | ||
---|---|---|
2 | EE | Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001) |
1999 | ||
1 | EE | Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274 |
1 | Hari Balachandran | [1] |
2 | Kenneth M. Butler | [1] [2] |
3 | Jennifer Dworak | [1] [2] |
4 | Michael R. Grimaila | [1] [2] |
5 | Bryan Houchins | [1] |
6 | Sooryong Lee | [1] [2] |
7 | Vineet Mathur | [1] |
8 | M. Ray Mercer | [1] [2] |
9 | Jaehong Park | [1] |
10 | Li-C. Wang | [1] [2] |
11 | Jason D. Wicker | [2] |