| 2002 |
|---|
| 6 | EE | Sooryong Lee,
Brad Cobb,
Jennifer Dworak,
Michael R. Grimaila,
M. Ray Mercer:
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.
DATE 2002: 94-101 |
| 5 | EE | Jennifer Dworak,
James Wingfield,
Brad Cobb,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.
DFT 2002: 177-185 |
| 2001 |
|---|
| 4 | EE | Jennifer Dworak,
Jason D. Wicker,
Sooryong Lee,
Michael R. Grimaila,
M. Ray Mercer,
Kenneth M. Butler,
Bret Stewart,
Li-C. Wang:
Defect-Oriented Testing and Defective-Part-Level Prediction.
IEEE Design & Test of Computers 18(1): 31-41 (2001) |
| 2000 |
|---|
| 3 | | Jennifer Dworak,
Michael R. Grimaila,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D.
ITC 2000: 930-939 |
| 1999 |
|---|
| 2 | | Jennifer Dworak,
Michael R. Grimaila,
Sooryong Lee,
Li-C. Wang,
M. Ray Mercer:
Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.
ITC 1999: 1031-1037 |
| 1 | EE | Michael R. Grimaila,
Sooryong Lee,
Jennifer Dworak,
Kenneth M. Butler,
Bret Stewart,
Hari Balachandran,
Bryan Houchins,
Vineet Mathur,
Jaehong Park,
Li-C. Wang,
M. Ray Mercer:
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.
VTS 1999: 268-274 |
