Ben Chu
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2001
1
EE
Julie Segal
,
Alvin Jee
,
David Y. Lepejian
, Ben Chu: Using Electrical Bitmap Results from Embedded Memory to Enhance Yield.
IEEE Design & Test of Computers 18
(3): 28-39 (2001)
Coauthor
Index
1
Alvin Jee
[
1
]
2
David Y. Lepejian
[
1
]
3
Julie Segal
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
