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Julie Segal

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2002
2EEJulie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up. VTS 2002: 177-180
2001
1EEJulie Segal, Alvin Jee, David Y. Lepejian, Ben Chu: Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Design & Test of Computers 18(3): 28-39 (2001)

Coauthor Index

1Rob Aitken [2]
2Ben Chu [1]
3S. Eichenberge [2]
4A. Gattike [2]
5Alvin Jee [1]
6David Y. Lepejian [1]
7M. Millegen [2]
8R. Seger [2]
9Rene Segers [2]
10S. Venkataraman [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)