Julie Segal

2002
2	EE	Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up. VTS 2002: 177-180
2001
1	EE	Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu: Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Design & Test of Computers 18(3): 28-39 (2001)

Coauthor Index

1	Rob Aitken	[2]
2	Ben Chu	[1]
3	S. Eichenberge	[2]
4	A. Gattike	[2]
5	Alvin Jee	[1]
6	David Y. Lepejian	[1]
7	M. Millegen	[2]
8	R. Seger	[2]
9	Rene Segers	[2]
10	S. Venkataraman	[2]

Colors in the list of coauthors