| |
| 2001 | ||
|---|---|---|
| 1 | EE | Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001) |
| 1 | Kenneth M. Butler | [1] |
| 2 | Jennifer Dworak | [1] |
| 3 | Michael R. Grimaila | [1] |
| 4 | Sooryong Lee | [1] |
| 5 | M. Ray Mercer | [1] |
| 6 | Bret Stewart | [1] |
| 7 | Li-C. Wang | [1] |