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1998 | ||
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1 | Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian: A D&T Roundtable: Testing Mixed Logic and DRAM Chips. IEEE Design & Test of Computers 15(2): 86-92 (1998) |
1 | Meh-Ron Amerian | [1] |
2 | Ian Burgess | [1] |
3 | Gary D. Fleeman | [1] |
4 | David Y. Lepejian | [1] |
5 | T. W. Williams | [1] |
6 | Farzad Zarrinfar | [1] |
7 | Yervant Zorian | [1] |