Yuri V. Malyshenko
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1998
1
EE
Yuri V. Malyshenko: Functional Fault Models for Analog Circuits.
IEEE Design & Test of Computers 15
(2): 80-85 (1998)
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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