| 1999 |
|---|
| 9 | | Wayne M. Needham:
Nanometer Technology Challenges for Test and Test Equipment.
IEEE Computer 32(11): 52-57 (1999) |
| 1998 |
|---|
| 8 | EE | Wayne M. Needham,
Cheryl Prunty,
Yeoh Eng Hong:
High volume microprocessor test escapes, an analysis of defects our tests are missing.
ITC 1998: 25-34 |
| 7 | EE | Peter C. Maxwell,
Steve Baird,
Wayne M. Needham,
Al Crouch,
Phil Nigh:
Best Methods for At-Speed Testing?
VTS 1998: 460-461 |
| 6 | | Wayne M. Needham:
Guest Editor's Introduction: Microprocessor Testing Today.
IEEE Design & Test of Computers 15(3): 56-57 (1998) |
| 1997 |
|---|
| 5 | | Phil Nigh,
Wayne M. Needham,
Kenneth M. Butler,
Peter C. Maxwell,
Robert C. Aitken,
Wojciech Maly:
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.
ITC 1997: 1037-1038 |
| 4 | EE | Wayne M. Needham:
Just how real is the SIA roadmap.
ITC 1997: 1151 |
| 3 | EE | Magdy S. Abadir,
Jacob A. Abraham,
H. Hao,
C. Hunter,
Wayne M. Needham,
Ron G. Walther:
Microprocessor Test and Validation: Any New Avenues?
VTS 1997: 458-464 |
| 2 | EE | Phil Nigh,
Wayne M. Needham,
Kenneth M. Butler,
Peter C. Maxwell,
Robert C. Aitken:
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.
VTS 1997: 459 |
| 1996 |
|---|
| 1 | | Wayne M. Needham,
Naga Gollakota:
DFT Strategy for Intel Microprocessors.
ITC 1996: 396-399 |
