| 2003 |
|---|
| 8 | EE | William V. Huott:
Diagnosis in Modern Design to Volume - The Tip of the Iceberg.
ITC 2003: 1304 |
| 2001 |
|---|
| 7 | | Mary P. Kusko,
Bryan J. Robbins,
Timothy J. Koprowski,
William V. Huott:
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.
ITC 2001: 586-592 |
| 1999 |
|---|
| 6 | | William V. Huott,
Moyra K. McManus,
Daniel R. Knebel,
Steve Steen,
Dennis Manzer,
Pia Sanda,
Steve Wilson,
Yuen H. Chan,
Antonio Pelella,
Stanislav Polonsky:
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).
ITC 1999: 883-891 |
| 1998 |
|---|
| 5 | EE | Mary P. Kusko,
Bryan J. Robbins,
Thomas J. Snethen,
Peilin Song,
Thomas G. Foote,
William V. Huott:
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
ITC 1998: 717-726 |
| 4 | EE | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Mary P. Kusko,
Bryan J. Robbins:
Testing the 500-MHz IBM S/390 Microprocessor.
IEEE Design & Test of Computers 15(3): 83-89 (1998) |
| 1997 |
|---|
| 3 | | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko:
Testing the 400-MHz IBM Generation-4 CMOS Chip.
ITC 1997: 106-114 |
| 2 | EE | Leon J. Sigal,
James D. Warnock,
Brian W. Curran,
Yuen H. Chan,
Peter J. Camporese,
Mark D. Mayo,
William V. Huott,
Daniel R. Knebel,
Ching-Te Chuang,
James P. Eckhardt,
Philip T. Wu:
Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor.
IBM Journal of Research and Development 41(4&5): 489-504 (1997) |
| 1 | EE | William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko,
Stephen Pateras,
Dale E. Hoffman,
Timothy G. McNamara,
Thomas J. Snethen:
Advanced microprocessor test strategy and methodology.
IBM Journal of Research and Development 41(4&5): 611-628 (1997) |
