2007 |
6 | EE | Richard F. Rizzolo,
Thomas G. Foote,
James M. Crafts,
David A. Grosch,
Tak O. Leung,
David J. Lund,
Bryan L. Mechtly,
Bryan J. Robbins,
Timothy J. Slegel,
Michael J. Tremblay,
Glen A. Wiedemeier:
IBM System z9 eFUSE applications and methodology.
IBM Journal of Research and Development 51(1/2): 65-76 (2007) |
2001 |
5 | | Mary P. Kusko,
Bryan J. Robbins,
Timothy J. Koprowski,
William V. Huott:
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.
ITC 2001: 586-592 |
1998 |
4 | EE | Mary P. Kusko,
Bryan J. Robbins,
Thomas J. Snethen,
Peilin Song,
Thomas G. Foote,
William V. Huott:
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip.
ITC 1998: 717-726 |
3 | EE | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Mary P. Kusko,
Bryan J. Robbins:
Testing the 500-MHz IBM S/390 Microprocessor.
IEEE Design & Test of Computers 15(3): 83-89 (1998) |
1997 |
2 | | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko:
Testing the 400-MHz IBM Generation-4 CMOS Chip.
ITC 1997: 106-114 |
1 | EE | William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko,
Stephen Pateras,
Dale E. Hoffman,
Timothy G. McNamara,
Thomas J. Snethen:
Advanced microprocessor test strategy and methodology.
IBM Journal of Research and Development 41(4&5): 611-628 (1997) |