| |
| 1998 | ||
|---|---|---|
| 2 | Meh-Ron Amerian, William D. Atwell Jr., Ian Burgess, Gary D. Fleeman, David Y. Lepejian, T. W. Williams, Farzad Zarrinfar, Yervant Zorian: A D&T Roundtable: Testing Mixed Logic and DRAM Chips. IEEE Design & Test of Computers 15(2): 86-92 (1998) | |
| 1994 | ||
| 1 | EE | Farzad Zarrinfar: Economics of "design for test" to remain competitive in the 90s. J. Electronic Testing 5(2-3): 171-177 (1994) |
| 1 | Meh-Ron Amerian | [2] |
| 2 | William D. Atwell Jr. | [2] |
| 3 | Ian Burgess | [2] |
| 4 | Gary D. Fleeman | [2] |
| 5 | David Y. Lepejian | [2] |
| 6 | T. W. Williams | [2] |
| 7 | Yervant Zorian | [2] |