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Vladimir Székely

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2008
19EEP. G. Szabo, Vladimir Székely: Characterization and Modeling of an Electro-thermal MEMS Structure CoRR abs/0805.0863: (2008)
18EEZoltán Szucs, György Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization of High Temperature Test Chamber CoRR abs/0805.0865: (2008)
2007
17EEGyörgy Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array CoRR abs/0711.3324: (2007)
2006
16 György Bognár, Gyula Horváth, Zoltán Szucs, Vladimir Székely: Die Attach Quality Testing by Fully Contact-less Measurement Method. DDECS 2006: 81-82
2004
15 Vladimir Székely: Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). Microelectronics Journal 35(10): 789-790 (2004)
2003
14EEMárta Rencz, Vladimir Székely, András Poppe: A Fast Algorithm for the Layout Based Electro-Thermal Simulation. DATE 2003: 11032-11037
2002
13EEVladimir Székely: Enhancing reliability with thermal transient testing. Microelectronics Reliability 42(4-5): 629-640 (2002)
2000
12EEMárta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
1999
11 Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
1998
10EEVladimir Székely, Márta Rencz: Fast Field Solvers for Thermal and Electrostatic Analysis. DATE 1998: 518-523
9EEVladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
8EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
7EEJean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
6EEVladimir Székely, A. Pahi, András Poppe, Márta Rencz, A. Csendes: SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. ED&TC 1997: 617
5EEVladimir Székely, Márta Rencz: Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. ICCAD 1997: 684-689
4EEVladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
3EEVladimir Székely, András Poppe, A. Pahi, A. Csendes, G. Hajas, Márta Rencz: Electro-thermal and logi-thermal simulation of VLSI designs. IEEE Trans. VLSI Syst. 5(3): 258-269 (1997)
2EEVladimir Székely, C. Marta, Z. Kohari, Márta Rencz: CMOS sensors for on-line thermal monitoring of VLSI circuits. IEEE Trans. VLSI Syst. 5(3): 270-276 (1997)
1996
1EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288

Coauthor Index

1György Bognár [16] [17] [18]
2Hicham Boutamine [7]
3Bernard Courtois [1] [4] [7] [8] [9] [11] [12]
4A. Csendes [3] [6]
5P. Drake [7]
6Manfred Glesner [7] [11]
7G. Hajas [3]
8Klaus Hofmann [7] [11]
9Gyula Horváth [16]
10Jean-Michel Karam [1] [7] [8] [11]
11Z. Kohari [2]
12Marcelo Lubaszewski [1] [8] [11]
13C. Marta [2]
14Salvador Mir [11]
15A. Pahi [3] [6]
16András Poppe [3] [6] [7] [14]
17Márta Rencz [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [14] [17] [18]
18P. G. Szabo [19]
19Zoltán Szucs [16] [18]
20Kholdoun Torki [12]
21S. Török [12]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)