Vladimir Székely

2008
19	EE	P. G. Szabo, Vladimir Székely: Characterization and Modeling of an Electro-thermal MEMS Structure CoRR abs/0805.0863: (2008)
18	EE	Zoltán Szucs, György Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization of High Temperature Test Chamber CoRR abs/0805.0865: (2008)
2007
17	EE	György Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array CoRR abs/0711.3324: (2007)
2006
16		György Bognár, Gyula Horváth, Zoltán Szucs, Vladimir Székely: Die Attach Quality Testing by Fully Contact-less Measurement Method. DDECS 2006: 81-82
2004
15		Vladimir Székely: Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). Microelectronics Journal 35(10): 789-790 (2004)
2003
14	EE	Márta Rencz, Vladimir Székely, András Poppe: A Fast Algorithm for the Layout Based Electro-Thermal Simulation. DATE 2003: 11032-11037
2002
13	EE	Vladimir Székely: Enhancing reliability with thermal transient testing. Microelectronics Reliability 42(4-5): 629-640 (2002)
2000
12	EE	Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
1999
11		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
1998
10	EE	Vladimir Székely, Márta Rencz: Fast Field Solvers for Thermal and Electrostatic Analysis. DATE 1998: 518-523
9	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
8	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
7	EE	Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
6	EE	Vladimir Székely, A. Pahi, András Poppe, Márta Rencz, A. Csendes: SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. ED&TC 1997: 617
5	EE	Vladimir Székely, Márta Rencz: Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. ICCAD 1997: 684-689
4	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
3	EE	Vladimir Székely, András Poppe, A. Pahi, A. Csendes, G. Hajas, Márta Rencz: Electro-thermal and logi-thermal simulation of VLSI designs. IEEE Trans. VLSI Syst. 5(3): 258-269 (1997)
2	EE	Vladimir Székely, C. Marta, Z. Kohari, Márta Rencz: CMOS sensors for on-line thermal monitoring of VLSI circuits. IEEE Trans. VLSI Syst. 5(3): 270-276 (1997)
1996
1	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288

Coauthor Index

1	György Bognár	[16] [17] [18]
2	Hicham Boutamine	[7]
3	Bernard Courtois	[1] [4] [7] [8] [9] [11] [12]
4	A. Csendes	[3] [6]
5	P. Drake	[7]
6	Manfred Glesner	[7] [11]
7	G. Hajas	[3]
8	Klaus Hofmann	[7] [11]
9	Gyula Horváth	[16]
10	Jean-Michel Karam	[1] [7] [8] [11]
11	Z. Kohari	[2]
12	Marcelo Lubaszewski	[1] [8] [11]
13	C. Marta	[2]
14	Salvador Mir	[11]
15	A. Pahi	[3] [6]
16	András Poppe	[3] [6] [7] [14]
17	Márta Rencz	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [14] [17] [18]
18	P. G. Szabo	[19]
19	Zoltán Szucs	[16] [18]
20	Kholdoun Torki	[12]
21	S. Török	[12]

Colors in the list of coauthors