| 1999 |
|---|
| 7 | | R. Scott Fetherston,
Imtiaz P. Shaik,
Siyad C. Ma:
A comparison of bridging fault simulation methods.
ITC 1999: 587-595 |
| 1998 |
|---|
| 6 | EE | R. Scott Fetherston,
Imtiaz P. Shaik,
Siyad C. Ma:
Testability Features of the AMD-K6 Microprocessor.
IEEE Design & Test of Computers 15(3): 64-69 (1998) |
| 1997 |
|---|
| 5 | | R. Scott Fetherston,
Imtiaz P. Shaik,
Siyad C. Ma:
Testability Features of AMD-K6TM Microprocessor.
ITC 1997: 406-413 |
| 1996 |
|---|
| 4 | | Piero Franco,
Siyad C. Ma,
Jonathan Chang,
Yi-Chin Chu,
Sanjay Wattal,
Edward J. McCluskey,
Robert L. Stokes,
William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip.
ITC 1996: 691-700 |
| 1995 |
|---|
| 3 | | Siyad C. Ma,
Piero Franco,
Edward J. McCluskey:
An Experimental Chip to Evaluate Test Techniques: Experiment Results.
ITC 1995: 663-672 |
| 2 | EE | Siyad C. Ma,
Edward J. McCluskey:
Open faults in BiCMOS gates.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 567-575 (1995) |
| 1992 |
|---|
| 1 | | Siyad C. Ma,
Edward J. McCluskey:
Non-Conventional Faults in BiCMOS Digital Circuits.
ITC 1992: 882-891 |
