| 2001 |
|---|
| 4 | | Mary P. Kusko,
Bryan J. Robbins,
Timothy J. Koprowski,
William V. Huott:
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor.
ITC 2001: 586-592 |
| 1998 |
|---|
| 3 | EE | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Mary P. Kusko,
Bryan J. Robbins:
Testing the 500-MHz IBM S/390 Microprocessor.
IEEE Design & Test of Computers 15(3): 83-89 (1998) |
| 1997 |
|---|
| 2 | | Thomas G. Foote,
Dale E. Hoffman,
William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko:
Testing the 400-MHz IBM Generation-4 CMOS Chip.
ITC 1997: 106-114 |
| 1 | EE | William V. Huott,
Timothy J. Koprowski,
Bryan J. Robbins,
Mary P. Kusko,
Stephen Pateras,
Dale E. Hoffman,
Timothy G. McNamara,
Thomas J. Snethen:
Advanced microprocessor test strategy and methodology.
IBM Journal of Research and Development 41(4&5): 611-628 (1997) |
