![]() | ![]() |
1998 | ||
---|---|---|
2 | EE | Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong: Alpha 21164 Manufacturing Test Development and Coverage Analysis. IEEE Design & Test of Computers 15(3): 98-104 (1998) |
1997 | ||
1 | Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong: Manufacturing Pattern Development for the Alpha 21164 Microprocessor. ITC 1997: 278-285 |
1 | Richard Davies | [1] [2] |
2 | Pamela McKernan | [1] [2] |
3 | Carol Stolicny | [1] [2] |