Márta Rencz

2008
25	EE	Gergely Nagy, Zoltán Szucs, S. Hodossy, Márta Rencz, András Poppe: Comparison of Two Low-Power Electronic Interfaces for Capacitive Mems Sensors CoRR abs/0802.3049: (2008)
24	EE	Domonkos Szente-Varga, Gyula Horvath, Márta Rencz: Ni-MH battery modelling for ambient intelligence applications CoRR abs/0802.3053: (2008)
23	EE	Zoltán Szucs, Márta Rencz: A novel method for fatigue testing of MEMS devices containing movable elements CoRR abs/0802.3091: (2008)
22	EE	Zoltán Szucs, György Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization of High Temperature Test Chamber CoRR abs/0805.0865: (2008)
2007
21		András Timár, Márta Rencz: Design Issues of a Low Frequency Low-Pass Filter for Medical Applications Using CMOS Technology. DDECS 2007: 325-328
20	EE	P. Szabo, B. Nemeth, Márta Rencz, Bernard Courtois: Characterisation of the Etching Quality in Micro-Electro-Mechanical Systems by Thermal Transient Methodology CoRR abs/0711.3301: (2007)
19	EE	György Bognár, Vladimir Székely, Márta Rencz: Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array CoRR abs/0711.3324: (2007)
18	EE	Márta Rencz: Thermal investigations of integrated circuits in systems at THERMINIC'05. Microelectronics Journal 38(2): 149-150 (2007)
2006
17	EE	Márta Rencz: Foreword: Thermal investigations of integrated circuits and systems at THERMINIC'04. Microelectronics Journal 37(11): 1147 (2006)
2003
16	EE	Márta Rencz, Vladimir Székely, András Poppe: A Fast Algorithm for the Layout Based Electro-Thermal Simulation. DATE 2003: 11032-11037
15	EE	Márta Rencz: Thermal investigations of integrated circuits and systems at THERMINIC'02. Microelectronics Journal 34(12): 1113-1114 (2003)
14	EE	Márta Rencz: New possibilities in the thermal evaluation, offered by transient testing. Microelectronics Journal 34(3): 171-177 (2003)
2000
13	EE	Salvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
12	EE	Márta Rencz, Vladimir Székely, S. Török, Kholdoun Torki, Bernard Courtois: IDDQ Testing of Submicron CMOS - by Cooling? J. Electronic Testing 16(5): 453-461 (2000)
1999
11		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
1998
10	EE	Vladimir Székely, Márta Rencz: Fast Field Solvers for Thermal and Electrostatic Analysis. DATE 1998: 518-523
9	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Tracing the Thermal Behavior of ICs. IEEE Design & Test of Computers 15(2): 14-21 (1998)
8	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
7	EE	Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, András Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: CAD and Foundries for Microsystems. DAC 1997: 674-679
6	EE	Vladimir Székely, A. Pahi, András Poppe, Márta Rencz, A. Csendes: SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. ED&TC 1997: 617
5	EE	Vladimir Székely, Márta Rencz: Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. ICCAD 1997: 684-689
4	EE	Vladimir Székely, Márta Rencz, Bernard Courtois: Integrating on-chip temperature sensors into DfT schemes and BIST architectures. VTS 1997: 440-445
3	EE	Vladimir Székely, András Poppe, A. Pahi, A. Csendes, G. Hajas, Márta Rencz: Electro-thermal and logi-thermal simulation of VLSI designs. IEEE Trans. VLSI Syst. 5(3): 258-269 (1997)
2	EE	Vladimir Székely, C. Marta, Z. Kohari, Márta Rencz: CMOS sensors for on-line thermal monitoring of VLSI circuits. IEEE Trans. VLSI Syst. 5(3): 270-276 (1997)
1996
1	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288

Coauthor Index

1	György Bognár	[19] [22]
2	Hicham Boutamine	[7]
3	Benoît Charlot	[13]
4	Philippe Coste	[13]
5	Bernard Courtois	[1] [4] [7] [8] [9] [11] [12] [13] [20]
6	A. Csendes	[3] [6]
7	P. Drake	[7]
8	Manfred Glesner	[7] [11]
9	G. Hajas	[3]
10	S. Hodossy	[25]
11	Klaus Hofmann	[7] [11]
12	Gyula Horvath	[24]
13	Ahmed Amine Jerraya	[13]
14	Jean-Michel Karam	[1] [7] [8] [11]
15	Z. Kohari	[2]
16	Marcelo Lubaszewski	[1] [8] [11]
17	C. Marta	[2]
18	Salvador Mir	[11] [13]
19	Gergely Nagy	[25]
20	B. Nemeth	[20]
21	Gabriela Nicolescu	[13]
22	A. Pahi	[3] [6]
23	Fabien Parrain	[13]
24	András Poppe	[3] [6] [7] [16] [25]
25	P. Szabo	[20]
26	Vladimir Székely	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [16] [19] [22]
27	Domonkos Szente-Varga	[24]
28	Zoltán Szucs	[22] [23] [25]
29	András Timár	[21]
30	Kholdoun Torki	[12]
31	S. Török	[12]
32	Nacer-Eddine Zergainoh	[13]

Colors in the list of coauthors